Publications
Found 3 results
Filters: Author is Bert Vermeire [Clear All Filters]
“Total Ionizing Dose Assessment of a Commercial 200V PMOSFET”, in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018.
, “Proton Radiation Effects Assessment of a Commercial 12-Megapixel CMOS Imager”, in Radiation Effects Data Workshop (REDW), 2017 IEEE, 2017, pp. 1-7.
, “Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC”, in Radiation Effects Data Workshop (REDW), 2017 IEEE, 2017, pp. 1-6.
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